Die/Wafer Probe Card
Theory
Particle Interconnect lead frame package
Solder bumped chip (ILB) on Particle Interconnect lead frame (OLB). | Particle Interconnect bumped chip (ILB) on Particle Interconnect lead frame (OLB). |
SEM's of contact surface
Tin-Lead solder over Nickel coated particles.
22x magnification with 88x zoom view.
BGA
Particle Interconnect - Sandia Lab Known Good Die (KGD)
Known-Good-Die probe/burn-in. Proof of removable die MCM-L/D/C.
- 0.030" pitch 19x19 miniBGA.
- Burn-in at 125 ° C, 168 hours.
- 0 failures, 100+ runs, no deformation.
0 failures, 11 runs shown above. | Particle Interconnect surface mount BGA socket. |
Particle Interconnect - Sandia mBGA interposer schematic. | Sandia mBGA interposer |
Particle Interconnect - Hughes Aircraft 1988 - 1989
50,000 die joint production test venture.
Before burned-in:
- No bump deformation.
- Die Sn/Pb 3/97, socket Au 100, load 1 gm/mil2 pad to socket. Burned-in 125 ° C for 168 hours. Particles milled into gold ceramic ink and fired onto ceramic substrate. (Depression in center of bump is aluminum die pad covered by protective passivation layer.)
50x bumped chip before pressing against PI gold thick film. | 500x bump before contacting PI. |
After burned-in:
- No bump deformation.
- PI/gold bonded to tin/lead bump and was ripped off substrate. Resulting in using nickel as higher strength Particle Interconnect bond layer in future test socket/temporary contact usages and other metal combinations in permanent usages.
50x bumped chip after pressing against PI gold thick film metal matrix with 1 gm/mil2 load. | 500x bump after contacting PI, metal matrix is on bump. |
Particle Interconnect - Hughes environmental test die
Particle Interconnect removable MCM die socket.
100% of 500 die lot survived 4x Mil-Std-883C.
- Particle Interconnect with both adhesive and mechanical hold-down of chips while accumulating 4 runs of:
- 168 hours (672 hours total) 125 ° C for burn-in (other test passed are continuous 125 ° C),
- 500 cycles (2,000 cycles total) -55 to +125 ° C fast ramp MIL-STD-883C shock test,
- 24 hours (96 hours total) in salt/fog corrosion test,
- 24 hours (96 hours total) HAST (Highly Accelerated Stress Testing) pressure chamber (30 psi, +125 ° C pressure pot),
- Results in 50,000 die lot test prior to transfer into production.
- 96/4 Pb/Sn reflowed plated bump to spherize with special passivation configuration.
- Die orientated same as CAD picture for clarity (see: Removable die MCM - L/D/C).
- Note contact resistance test pads on left edge.
- Note traces for passivation crack detection.
- Note temperature sensors in center of die.
- Note traces for edge crack detection.
- Note traces for die heating.
- Note Particle Interconnect imprint.
Particle Interconnect piercing SDRAM DDR1 package balls
- Demonstrating damage free performance when exposed to excessive loading.
- 60 pounds of force on 60 balls.
- Note minor depth of penetration.
Particle Interconnect surface mount BGA socket
0.030" pitch, 19x19 version.
Particle Interconnect - MMS - TI - HP bare die probe
Proof of removable Known-Good-Die. Note single layer of particle on pad.
IEEE Transactions on Components, Packaging, And Manufacturing Technology
A Bare-Chip Probe for High I/O, High Speed Testing
Alan Barber, Keunmyung Lee, and Hannsjorg Obermaier
Examples
Particle Interconnect Package (PIP)
Advanced low-cost minimal IC package.
QFP 132 lead, 0.012" pitch OLB (Outer Lead Bond). | Leadframe / Chip-On-Board socket & carrier. |
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Removable die MCM
Removable die Multichip Module - L/D/C
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Removable die MCM | Louver contact |
- Low-cost heat exchanger designed for modular dissipation needs.
- Removable die locator (precisor) aligns all die on 0.010" edge-to-edge mosaic tile pattern of silicon.
- Precisor is accurately aligned by corner guide pins in heat sink.
- Removable die PI interposer sockets die to PCB and spring loads die against heat sink.
- Interposer is accurately aligned by corner guide pins in heat sink.
- Removable die PI interposers with 0.001" - 0.008" travel on 0.001" - 0.030" pitch are available.
- Removable multilayer PCB interconnects all die together with controlled impedance from die pad to die to pad.
- PI vias between laminate layers allow 0.002" "blind" vias by punching through adhesive layer during lamination.
- PCB is accurately aligned by corner guide pins in heat sink.
- Removable package PI interposer sockets package to PCB and spring loads package to PCB.
- MCM is accurately aligned and held to PCB by corner guide pins for manual or automatic insertion.
- Package interposers with 0.08"-0.020" travel on 0.010"-0.050" pitch with either peripheral or array patterns available.
- Die are removable by simply unstacking layers.
- Both bumped and wire bond die pads are mixable.